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The magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction. MFM scanning often uses non-contact AFM (NC-AFM) mode. ==Overview== In MFM measurements, the magnetic force between the sample and the tip can be expressed as : where is the magnetic moment of the tip (approximated as a point dipole), is the magnetic stray field from the sample surface, and ''µ0'' is the magnetic permeability of free space. Because the stray magnetic field from the sample can affect the magnetic state of the tip, and vice versa, interpretation of the MFM measurement is not straightforward. For instance, the geometry of the tip magnetization must be known for quantitative analysis. Typical resolution of 30 nm can be achieved, although resolutions as low as 10 to 20 nm are attainable.〔(Nanoscan AG, Quantum Leap in Hard Disk Technology )〕 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Magnetic force microscope」の詳細全文を読む スポンサード リンク
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